All Products of Microelectronics Solutions

Basic Plasma Cleaner

Basic Plasma Cleaner

Our Basic Plasma Cleaner is a compact, inexpensive tabletop plasma instrument with a redesigned hinged door and viewing window, active fan cooling and improved metering valve, suitable for nanoscale surface cleaning and activation...
Expanded Plasma Cleaner

Expanded Plasma Cleaner

Our Expanded Cleaner is a larger tabletop plasma instrument with four times the capacity of the basic plasma cleaner, extensively used for nanoscale surface cleaning and surface activation.
High Power Expanded Plasma Cleaner

High Power Expanded Plasma Cleaner

With twice the cleaning rate as the Expanded Plasma Cleaner, the High Power Expanded Plasma Cleaner is a versatile instrument, suitable for etching organic thin films (10-100 nm) as well as surface activation and modification.
Benchtop UV-Ozone Cleaner PSD-UV

Benchtop UV-Ozone Cleaner PSD-UV

Surface treatment for AFM, SEM, TEM, Wafer, Glass, PDMS, and etc.
UV-LED Exposure-Masking System UV-KUB2

UV-LED Exposure-Masking System UV-KUB2

The exposure and masking system UV-KUB 2, is the first UV-LED masking system available on the international market. The UV-KUB 2 is a compact exposure-masking system equipped with an LED based optical head, collimated and homogene...
UV-LED Mask Aligner UV-KUB3

UV-LED Mask Aligner UV-KUB3

The mask aligner UV-KUB 3 is the first mask alignement system equipped with a UV-LED source on the international market.
UV Nanoimprint System EZI PL400/600

UV Nanoimprint System EZI PL400/600

EZImprinting is a super-high yield (> 99 %) nanoimprint lithography platform with sub-10 nm resolution and one-step Auto Release™ function.
Manual Probe Station SPS-1000

Manual Probe Station SPS-1000

Small, ergonomic, and convenient to use, this system is ideal for laboratory testing and characterization of semiconductor devices and circuits.
Semi-Automated Probe Station SPS-2600

Semi-Automated Probe Station SPS-2600

MicroXact’s semi-automated probe stations, designed to be flexible and easy to use when performing high productivity device characterization, wafer level reliability testing and failure analysis.
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