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Material Science & Nanotechnology
All Products of Material Characterisation
Non-Contact Thin Film Measurement EddyCus TF Lab 2020
Non-contact sheet resistance and layer thickness measurement device for single point measurements
Non-contact Sheet Resistance Mapping EddyCus TF Map 2525
The EddyCus TF map 2525SR automatically measures the sheet resistance of large samples up to 250 x 250 mm² (10 x 10 inches) in non-contact mode
Non-contact Sheet Resistance Sensor EddyCus TF Inline
Non-contact sheet resistance and layer thickness measurement solutions for process control
Cathodoluminescence Spectroscopy Grammont 2172
The First Comprehensive Quantitative Cathodoluminescence Solution
Cathodoluminescence Spectroscopy Allalin 4027
Blazing Fast Multi-Channel Cathodoluminescence at Low Temperature
Cathodoluminescence Spectroscopy Rosa 4634
Quantitative Cathodoluminescence Dedicated to Photovoltaic and Silicon Applications
Cathodoluminescence for STEM Mönch 4107
High throughput and high efficiency Cathodoluminescence for STEM
Portable Profilometer Jr25
The Jr25 is the first truly portable high performance Profilometer of its kind. With an optional battery pack and carrying case, the Jr25 provides measurement capability during field studies.
Compact Profilometer PS50
The PS50 is the most advanced compact Profilometer available
Profilometer ST400
The ST400 is ideal for a wide range of samples with varied geometries.
Large Area Profilometer ST500
The ST500 provides fast large area measurement (without stitching) using a 400 mm X-Y axis travel with a maximum speed up to 200 mm/s
High Speed Profilometer HS2000
The HS2000 provides automated optical inspection at high speeds (up to 1m/s & data acquisition up to 31KHz) for quality control applications where speed and large areas or multiple measurements is critical.
CB500 Compact Material Mechanical Tester
Compact and powerful mechanical tester.
T50 Versatile Tribometer
Versatile Surface Tribometer.
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