Use of a continuously variable slit
The UH5700 employs a continuously variable slit in the near-infrared region, in which the slit automatically widens when measuring low quantities of light and narrows when measuring large quantities of light, and thereby achieves low-noise measurements across a broad range of measurement wavelengths from 190 to 3,300 nm
Low stray light
The UH5700 achieves best-in-class levels of low stray light and high photometric range through use of a Czerny-Turner mounted single-monochromator bright spectrometer and a newly developed grating using photolithography technology. *1
*1Hitachi High-Tech Science survey of models marketed within Japan (single monochromator instruments supporting near-infrared wavelength range) as of April 2019
Measurement throughput improvements
By employing a gear-drive system for the wavelength drive, high scanning speeds compared to conventional instruments are achieved of approximately 0.3 to 5,000 nm/min in the ultraviolet-visible region. *2 When measuring at a 1 nm interval, a measurement made at 1,000 nm/min in the 190 to 3,300 range can be completed in approximately 4 minutes.
*2U-3900 : 1.5 to 2,400 nm/min, U-2900 : 10 to 3,600 nm/min.
Control of detector switching level difference
Generally, UV-visible/near-infrared spectrophotometers use different detectors in the UV-visible region and the near-infrared region. Because different detectors are used, a difference in photometric values may arise in switching between detectors. Through know-how developed from the fundamentals, signal processing technology, and other techniques, the UH5700 holds the level difference when switching detectors to a minimum