MicroXact’s semi-automated probe stations, designed to be flexible and easy to use when performing high productivity device characterization, wafer level reliability testing and failure analysis.
Motorized XY chuck, motorized platen in SPS-2600, motorized Z movement of the chuck in SPS 2800 in standard configuration. Motorized theta is an option.
Stepper motor-based, no encoders.
Very cost competitive
Highly recommended in applications where sub-0°C testing or shielding is desired
Options available: heated or cooled chucks, zoom scopes or compound microscopes, various shielding, selection of the chucks for DC and RF measurements, and many more
Specification :
Wafer Size
Up to 100mm standard (up to 125mm as an option)
XY Stage
Travel
Up to 125mmx125mm
Resolution
Motorized, 1.5µm repeatability
Platen
Travel
12.7 mm or more
Adjustment
Dual coarse and fine control, better than 1.5µm repeatability
Planarity
<12.7µm across 150 mm
Rigidity
<50µm for 4.5 kg
Chuck
Vacuum
Multi-zone vacuum
Flatness
+/- 13 µm
Breakdown Voltage
At least 500 V
Isolation
At least 1GigaOhm
Adjustment
360° coarse, +/-6° fine
Microscope
High quality stereo zoom with up to 200mm working distance and magnification ranging from 3.5X to 180X