Profilometer ST400

With the optical video zoom or optical microscope, high magnification microscopy work can be done in combination with measuring roughness and other properties at precisely selected locations. An AFM integration expands the 3D capabilities into the sub nanometer range including laterally which is not attainable with any other optical technique. The advanced software makes it easy to select zones on the video to be scanned automatically by Profilometer or by the AFM. Quality control options are available to automate various aspects of testing including image pattern recognition, database communications, macros for automatic testing and analysis recipes. Chromatic Confocal line sensors are also available on this system to allow speed of up to 200 times faster than the single point sensor. Custom ST400’s are available for more open configurations that allow for larger X-Y stages, 360° rotational stages and many other custom configurations.

• Spacious & Open Platform • AFM & Microscopy Integration • High Sample Clearance • Customizable Options

For more information do visit https://nanovea.com/instruments/st400/