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Material Science & Nanotechnology
Atomic Force Microscope
Park NX7 Atomic Force Microscope
The most affordable research grade AFM with flexible sample handling
Park NX7 has all the state-of-the-art technology you have come to expect from Park Systems, at a price your lab can afford. Designed with the same attention to detail as our more advanced models, NX7 allows you to do your research on time and within budget.
Brand: Park Systems
Contact Us for better pricing.
Warranty Details
Accurate XY Scan by Crosstalk Elimination
- Two independent, closed-loop XY and Z flexure scanners
- Flat and orthogonal XY scan with low residual bow
- Accurate height measurements without any need for software processing
The Most Extensible AFM Solution
- The most comprehensive range of SPM modes
- Advanced nanomechanical measurement modes are supported as default enabled by NX electronic controller
- The best option compatibility and upgradeability in the industry
User Experience-Driven Software and Hardware Features
- Open side access for easy sample or tip exchange
- Easy, intuitive laser alignment with pre-aligned tip mount
- Park SmartScanTM - AFM operating software versatile enough to empower both novices and power users alike toward great nanoscale research
Specification :
| Z Scanner | flexure guided high-force scanner Scan range: 15 ?m (optional 30 ?m) |
| XY Scanner | single module flexure with closed-loop control Scan range: 50 µm × 50 µm (optional 10 ?m × 10 ?m or 100 ?m × 100 ?m) |
| Z stage range | 26 mm |
| XY stage range | 13 mm X 13 mm |
| Sample size | Up to 50 mm |
| Sample thickness | Up to 20 mm |
| SmartScanTM | AFM system control and data acquisition software Auto mode for quick setup and easy imaging Manual mode for advanced use and finer scan control |
| SmartAnalysisTM | AFM data analysis software Stand-alone design—can install and analyze data away from AFM Capable of producing 3D renders of acquired data |
