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Atomic Force Microscope

Park NX7 Atomic Force Microscope

Park NX7 Atomic Force Microscope

The most affordable research grade AFM with flexible sample handling Park NX7 has all the state-of-the-art technology you have come to expect from Park Systems, at a price your lab can afford. Designed with the same attention to detail as our more advanced models, NX7 allows you to do your research on time and within budget.
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Brand: Park Systems
Contact Us for better pricing. Warranty Details

Accurate XY Scan by Crosstalk Elimination

  • Two independent, closed-loop XY and Z flexure scanners
  • Flat and orthogonal XY scan with low residual bow
  • Accurate height measurements without any need for software processing

The Most Extensible AFM Solution

  • The most comprehensive range of SPM modes
  • Advanced nanomechanical measurement modes are supported as default enabled by NX electronic controller
  • The best option compatibility and upgradeability in the industry

 User Experience-Driven Software and Hardware Features

  • Open side access for easy sample or tip exchange
  • Easy, intuitive laser alignment with pre-aligned tip mount
  • Park SmartScanTM - AFM operating software versatile enough to empower both novices and power users alike toward great nanoscale research

 

Specification :
Z Scanner flexure guided high-force scanner Scan range: 15 ?m (optional 30 ?m)
XY Scanner single module flexure with closed-loop control Scan range: 50 µm × 50 µm (optional 10 ?m × 10 ?m or 100 ?m × 100 ?m)
Z stage range 26 mm
XY stage range 13 mm X 13 mm
Sample size Up to 50 mm
Sample thickness Up to 20 mm
SmartScanTM AFM system control and data acquisition software Auto mode for quick setup and easy imaging Manual mode for advanced use and finer scan control
SmartAnalysisTM AFM data analysis software Stand-alone design—can install and analyze data away from AFM Capable of producing 3D renders of acquired data
 
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