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Atomic Force Microscope

NX-20 Atomic Force Microscope

NX-20 Atomic Force Microscope

The leading nano metrology tool for failure analysis and large sample research.
Pricing & Availability Download Catalogue Park Systems
Brand: Park Systems
Contact Us for better pricing. Warranty Details

- Sidewall measurements for 3D structure study

- Surface roughness measurements for media and substrates

- High resolution electrical scan mode

- Accurate and Reproducible Measurements for Better Productivity

- Reproduce Best AFM Measurement

- True Sample Topography™ without piezo creep error

Specification :
XY Scanner
Scan range 100µm x 100µm
Z Scanner
Scan range 15 µm
Motorized Stage
XY travel range 150 mm
Z travel range 25 mm
Focus travel range 8 mm
Sample Mount Up to 150 mm
 
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