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Material Science & Nanotechnology
Atomic Force Microscope
NX-12 Atomic Force Microscope
A versatile microscopy platform for analytical chemistry researchers and shared user facilities.
Brand: Park Systems
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Warranty Details
- Atomic Force Microscopy (AFM) for nanometer resolution imaging with electrical, magnetic, thermal, and mechanical property measurement capabilities
- Pipette-based scanning system for high resolution Scanning Ion Conductance Microscopy (SICM), Scanning Electrochemical Microscopy (SECM), and Scanning Electrochemical Cell Microscopy (SECCM)
- Inverted Optical Microscopy (IOM) for transparent material research and fluorescence microscopy integration
- Easy optical access with motorized focus stage
- Park SmartScan™ makes scanning fast and simple
Specification :
| Scanner | |
| XY scanner range | 100 µm × 100 µm |
| AFM head Z scanner range | 15 µm, (optional 30 µm) |
| SICM head Z scanner range | 15 µm, (optional 30 µm) |
| Electronics | |
| ADC | 18 channels, 24-bit ADCs for X, Y, and Z scanner position sensor |
| DAC | 17 channels, 20-bit DACs for X, Y, and Z scanner positioning |
| Vision (AFM) | |
| Field-of-view | 840 µm × 630 µm (with 10× objective lens) |
| Camera | 5 M Pixel (default), 1 M Pixel (optional) |
