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Material Characterisation
Thin Film Measurement
Accurion EP4 Imaging Ellipsometer
The EP4, our latest generation of imaging ellipsometers, combines ellipsometry and microscopy. This enables the characterization of thickness and refractive index with the sensitivity of ellipsometry on micro-structures as small a...
Accurion i4 Series Active Vibration Isolation System
The i4 is a state-of-the-art active vibration isolation system. It is ideal for isolating high-resolution measurement equipment from building vibrations and other disturbances, while providing active compensation in all six degree...
SK-FTM Compact Thickness Film Monitor
Compact film thickness monitor is a small and highly accurate reflective spectroscopic film thickness meter that uses a reflective probe with excellent optical properties.
It also can be used as an in-line monitoe during the pro...
SK-FTM-MAP Wafer Mapping Film Thickness
Automatic mapping film thickness measurement over the entire surface of wafers up to 300 mm.
Handheld Sheet Resistance Tester EddyCus TF Portable 1010
Handheld device for sheet resistance measurement
Non-Contact Thin Film Measurement EddyCus TF Lab 2020
Non-contact sheet resistance and layer thickness measurement device for single point measurements
Non-contact Sheet Resistance Mapping EddyCus TF Map 2525
The EddyCus TF map 2525SR automatically measures the sheet resistance of large samples up to 250 x 250 mm² (10 x 10 inches) in non-contact mode
Non-contact Sheet Resistance Sensor EddyCus TF Inline
Non-contact sheet resistance and layer thickness measurement solutions for process control
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