Microxact

Microxact
Semi-Automated Probe Station SPS-2600

Semi-Automated Probe Station SPS-2600

MicroXact’s semi-automated probe stations, designed to be flexible and easy to use when performing high productivity device characterization, wafer level reliability testing and failure analysis.
Manual Probe Station SPS-1000

Manual Probe Station SPS-1000

Small, ergonomic, and convenient to use, this system is ideal for laboratory testing and characterization of semiconductor devices and circuits.
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